Spectral response of spider mite infested cotton: Mite density and miticide rate study

Authors

  • Yubin Lan PhD, Agricultural Engineer, Former President of AOC, USDA-ARS-SPARC, Adjunct Professor of Texas A&M University-College Station, TX
  • Huihui Zhang
  • W C Hoffmann
  • Jr. Juan D Lopez

Keywords:

spectral reflectance, infested cotton plants, crop protection, Normalized Difference Vegetative Index (NDVI), Temprano rate treatments

Abstract

Two-spotted spider mites are important pests in many agricultural systems. Spider mites (Acari: Tetranychidae) have been found to cause economic damage in corn, cotton, and sorghum. Adult glass vial bioassays indicate that Temprano? (abamectin) is the most toxic technical miticide for adult two-spotted spider mite. From an aerial application standpoint, additional research is needed to identify aerial application parameters for this miticide. The objective of this study was to investigate spectral response of spider mite-infested cotton plants with different density levels of mites and treated with different rates of miticide. Results showed significantly different spectral signatures of cotton plants infested with different density levels of mites. By treating mite-infested cotton plants with five different Temprano rate treatments (control, one-eighth, one-fourth, one-half, and full rates), spectral reflectance curves were found to be significantly different. Four wavelengths of 550 nm, 560 nm, 680 nm and 740 nm were important for detecting the spectral differences among mite infested cotton plants treated with various rate of Temprano. Normalized Difference Vegetative Index imagery was able to detect different levels of cotton plant damage. Half-rate application of Temprano controlled mite-infested plants as effectively as the full-rate application. These findings may lead to reduced cost and quantity of miticides used to maintain effective crop production and protection.

Author Biographies

Yubin Lan, PhD, Agricultural Engineer, Former President of AOC, USDA-ARS-SPARC, Adjunct Professor of Texas A&M University-College Station, TX

Yubin Lan, Ph.D., Agricultural Engineer USDA-ARS-SPARC-APMRU 2771 F&B Road College Station, TX 77845 Email: yubin.lan@ars.usda.gov Tel: (979)260-3759 Fax:(979)260-9386

Huihui Zhang

PhD, Research Agricultural Engineer, USDA-ARS Water Management Research Unit, Parlier, California, USA. Tel: 1-559-596-2832.

W C Hoffmann

PhD, Agricultural Engineer, USDA-ARS, College Station, Texas, USA. Tel: 1-979-260-9521.

Jr. Juan D Lopez

Research Entomologist (retired), USDA-ARS, College Station, Texas, USA. Tel: 1-979-260-9530.

References

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Published

2013-03-19

How to Cite

Lan, Y., Zhang, H., Hoffmann, W. C., & Juan D Lopez, J. (2013). Spectral response of spider mite infested cotton: Mite density and miticide rate study. International Journal of Agricultural and Biological Engineering, 6(1), 48–52. Retrieved from https://ijabe.migration.pkpps03.publicknowledgeproject.org/index.php/ijabe/article/view/620

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Section

Information Technology, Sensors and Control Systems